Measurement Of Submicron-Deformation Of Optical Elements Using Reflective Background Oriented Schlieren Technique

Authors:	A. S. Mungalov, D. Y. Kochkin, M. V. Pukhovoy, K. V. Zolotarev, O. A. Kabov
Journal:	EJMCA, Vol. 13, Issue 1 (2025)
ISSN:	2306-6172

Publisher: L.N. Gumilyov Eurasian National University

Frequency: 4 issues per year

Language: English

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